AST X2002 Stress Analyzer Offers Unmatched Performance

Author:  News Release
Source:  The Shot Peener magazine, Vol 6 / Issue 1, Spring 1992
Doc ID:  1992092
Year of Publication:  1992
Abstract:  
X-ray diffraction is the conventional and time proven technique for measuring residual stresses. Using the interatomic spacing as the ultimate gage length, x-ray technique is applicable to all crystalline materials and can measure absolute stress without the need of an unstressed sample for calibration.