X-Ray Diffraction Characterization of Residual Stresses Produced by Shot Peening

Author:  Paul S. Prevey, Pres., Lambda Research Inc.
Source:  The Shot Peener magazine, Vol 15 / Issue 1, Spring 2001
Doc ID:  2001019
Year of Publication:  2001
Abstract:  
Reprinted with permission from Shot Peening Theory and Application. Edited by Dr. A. Niku-Lari. First published by IITT-International, www.iitt.com ABSTRACT A brief overview of the theory and practice of x-ray diffraction residual stress measurement as applied to shot peened materials is presented. The unique ability of x-ray diffraction methods to determine both the macrosopic residual stress and the depth and magnitude of the cold worked layer produced by shot peening is described. The need to obtain a complete description of the subsurface residual stress distribution, in order to accurately characterize the residual stress distributions produced by shot peening is emphasized. Non-destructive surface residual stress measurements are shown to generally be inadequate to reliably characterize the residual stresses produced by shot peening. Practical applications of x-ray diffraction methods for quality control testing are considered. Examples are presented for steel and nickel base alloys.